IV characteristic measurement service
A service that can be used for various purposes in semiconductor IV characteristic measurement, ranging from simple thermal resistance evaluation to failure analysis.
We offer "IV characteristic measurement services." The IV characteristics of semiconductors are measured for various purposes as fundamental electrical measurements. They are utilized not only for regular product evaluations but also for failure analysis and simple assessments of thermal resistance. At a preliminary experimental level, relative comparisons among many samples can be made. We measure the change in VF characteristics at thermal saturation to evaluate the quality of thermal shrinkage. In addition to standalone IV measurements, simple inspections regarding the electrical-optical relationship and simple relative evaluations concerning the electrical-thermal relationship are also possible. You can consult us for various applications, including initial checks for anomaly analysis.
- Company：佐用精機製作所
- Price：Other
